Ari has 15 years of experience in automation and MEMS device test holding several positions in Afore. He joined Afore in 2006 as mechanical design engineer for sensor test equipment, and later worked in field service and research & development. Before taking his current position as AEM AFORE GM in 2020, Ari was responsible for all sales and marketing activities in Afore. He successfully expanded the Afore business outside of its domestic market and managed sales partners in USA, Asia and Europe.
As General Manager of the AEM AFORE Product Line, Ari Kuukkala is responsible to expand the Wafer Test Solutions business unit within existing and new customers. In close cooperation with CTO office and other product lines, Ari is responsible to bring new products to market, find new application areas to support growth and serve special application areas in semiconductor wafer test.
Improving Time to Market Using Probe Stations with Physical Stimulus
Today, MEMS and sensor manufacturer struggle with the need to shorten time-to-market while reducing development costs at the same time. Productivity, yield and performance may not be compromised to stay ahead in a competitive environment.
Design flaws introduced by immature design can result in increased manufacturing cost as well as decreased product quality.
The presentation outlines how to gain faster time-to-market by characterizing devices with real stimulus during device design, utilize this data to optimize design and manufacturability, and transfer test knowledge gained during characterization to low- and high-volume production.