A*STAR (Agency for Science, Technology and Research), Singapore
MWS EU 2022 Speaker
Nigel Beddoe is the Director Product Marketing Management – MEMS and Sensors for Cohu Inc. and is based out of Melaka, Malaysia.
After graduating from the University of Wales in Electrical and Electronic Engineering, Nigel has been in the Semiconductor Final Test environment since 1978. In his positions at previous companies such as Inmos (UK) and STMicroelectronics (Malaysia,), he has gained experience using a variety of semiconductor test solutions across the complete test process flow through to finishing. Since 2000 Nigel Beddoe has been with Multitest, a Cohu company, as a provider of semiconductor test cell solutions. Nigel has been focusing on MEMS final test solutions since 2012 and can benefit from an excellent network and experience with the big and new players of the market. He is currently driving the new Cohu High SNR Microphone test solution project with exciting feedback from the MEMS Microphone manufacturers.
Solving the Problem of High SNR Microphone Final Test Requirements
The forecast for high SNR MEMS microphones over the next 5 years is high growth and even higher SNR requirements The market is searching for a final test solution that can achieve high SNR specification in high volume manufacturing and can operate in a normal production floor. This solution has to provide highly accurate sound generation and measurement utilising an optimized sound isolation.
This presentation will show, using actual test data from customer samples, that Cohu has been able to solve the trilemma being faced by current solution providers.
- The need for the best possible sound isolation without the need for any anechoic chambers or rooms in a production environment.
- Repeatable and consistent contacting of the various pad layouts across the full device package range.
- A highly accurate sound source capable of reaching very high SPL levels with the highest THD accuracy specifications.
Cohu, Inc. (NASDAQ: Cohu) was founded in 1947 and has grown to become a leading supplier of semiconductor test automation and inspection equipment, micro-electromechanical system (MEMS) test modules, test contactors, thermal sub-systems and semiconductor automated test equipment used by global semiconductor manufacturers and their test subcontractors.
We deliver leading-edge solutions to enable a smarter, safer, and more connected future. Cohu offers the broadest portfolio of equipment and services for back-end semiconductor manufacturing, including a one-stop-shop for test and handling equipment, thermal subsystems, test contacting, vision inspection & metrology, and MEMS test solutions.
We provide our customers with outstanding products and services that reflect our commitment to operational excellence, innovation and market leadership.
Our enhanced product portfolio gives our customers the best possible combination of technologies to match their business and technical needs. Cohu’s product portfolio is focused on increasing yield, reducing cost of test and accelerating time-to-market.
12367 Crosthwaite Circle, Poway, CA 92061, USA
Telephone: +1 858 848 8000
Company products and service information
Cohu’s portfolio includes MEMS test and calibration equipment, handlers and inspection, ATE and interface solutions. Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip, turret-based handlers, MEMS test cells, and back-end finishing equipment.
Our MEMS and Sensor solutions combine the advantages of well-established and production-proven tri-temp test handling equipment with innovative concepts to meet the special requirements of the MEMS and Sensor market. The modular design concept allows the greatest flexibility for our customers as it allows ease of conversion between stimulus types. This flexibility and modularity provides the best return on investment by being able to react fast to market changes and accelerating time-to-market. MEMS modules are available for a variety of sensor test applications, for singulated devices in various input media and also the unique and cost-efficient test in carriers as well as test in strip, allowing the highest test parallelism in the market, and thus reducing cost of test.
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